Diagnostic measurements in LSI/VLSI integrated circuits production

Details 詳細情報について

• CRID

  1130282271144253440

• NII Book ID

  BA12908740

• ISBN

  9810202822

• LCCN

  91003700

• Web Site

  https://lccn.loc.gov/91003700

• Text Lang

  en

• Country Code

  si

• Title Language Code

  en

• Place of Publication

  • Singapore ; Teaneck, N.J.

• Classification

  • LCC: TK7874
  • DC20: 621.39/5

• Subject

  • LCSH: Integrated circuits -- Very large scale integration -- Design and construction
  • LCSH: Integrated circuits -- Very large scale integration -- Testing

• Data Source

  • CiNii Books