Scanning probe microscopy : atomic scale engineering by forces and currents

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Bibliographic Information

Title
"Scanning probe microscopy : atomic scale engineering by forces and currents"
Statement of Responsibility
A. Foster, W. Hofer
Publisher
  • Springer
Publication Year
  • c2006
Book size
24 cm

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Notes

Includes bibliographical references and index

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Details 詳細情報について

  • CRID
    1130282271345594880
  • NII Book ID
    BA77975040
  • ISBN
    0387400907
  • LCCN
    2005936713
  • Web Site
    https://lccn.loc.gov/2005936713
  • Text Lang
    en
  • Country Code
    gw
  • Title Language Code
    en
  • Place of Publication
    • Berlin
  • Data Source
    • CiNii Books
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