High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA

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Bibliographic Information

Title
"High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA"
Statement of Responsibility
editors, Robert Sinclair, David J. Smith, Ulrich Dahmen
Publisher
  • Materials Research Society
Publication Year
  • c1990
Book size
24 cm

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Notes

Inclcudes bibliographical references

Includes index

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