Analytical and diagnostic techniques for semiconductor materials, devices and processes 7

Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes, Schroder, D. K., Electrochemical Society. Meeting, Electrochemical Society. Electronics and Photonics, Electrochemical Society. Dielectric Science and Technology Division, European Solid State Device Research Conference

Analytical and diagnostic techniques for semiconductor materials, devices and processes 7

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書誌事項

タイトル: "Analytical and diagnostic techniques for semiconductor materials, devices and processes 7"

責任表示: editors, D. K. Schroder ... [et al.]. ; sponsoring divisions, Electronics and Photonics, Dielectric Science & Technology

出版者

Electrochemical Society

出版年月

c2007

書籍サイズ: 23 cm

シリーズ名/番号

: CD-ROM

タイトル別名

Analytical Techniques for Semiconductor Materials and Process Characterization
ALTECH

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注記

"... was part of the Fall 2007 Electrochemical Society Meeting in Washington, DC, held on October 7-12, 2007."--on pref

"... also contains a CD-ROM with the papers of the ALTECH 07 symposium Analytical Techniques for Semiconductor Materials and Process Characterization V, held as part of the Solid State Device Research Conference (ESSDERC) 2007 in Munich, Germany on September 13-14, 2007."--on pref

Includes bibliographical references and indexes

Analytical and diagnostic techniques for semiconductor materials, devices and processes 7

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Analytical and diagnostic techniques for semiconductor materials, devices and processes 7

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