Transmission electron microscopy and diffractometry of materials
CiNii
Available at 14 libraries
Bibliographic Information
- Title
- "Transmission electron microscopy and diffractometry of materials"
- Statement of Responsibility
- Brent Fultz, James Howe
- Publisher
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- Springer
- 2nd ed
- Publication Year
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- c2002
- Book size
- 24 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130282271912102400
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- NII Book ID
- BA59086328
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- ISBN
- 3540437649
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- Text Lang
- en
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- Country Code
- gw
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- Title Language Code
- en
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- Place of Publication
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- Berlin ; Tokyo
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- Classification
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- LCC: TA417.23
- DC21: 620.1/1299
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- Subject
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- LCSH: Materials -- Microscopy
- LCSH: Transmission electron microscopy
- LCSH: X-ray diffractometer
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- Data Source
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- CiNii Books
