Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California

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Bibliographic Information

Title
"Spectroscopic characterization techniques for semiconductor technology II : January 21-22, 1985, Los Angeles, California"
Statement of Responsibility
Fred H. Pollak, chairman/editor
Publisher
  • SPIE -- the International Society for Optical Engineering
Publication Year
  • c1985
Book size
28 cm

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Details 詳細情報について

  • CRID
    1130282271986205568
  • NII Book ID
    BA23996422
  • ISBN
    0892525592
  • LCCN
    85050424
  • Web Site
    https://lccn.loc.gov/85050424
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Bellingham, Wash.
  • Data Source
    • CiNii Books
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