Methods of measurement for semiconductor materials, process control, and devices: quarterly report, January 1 to March 31, 1969

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Bibliographic Information

Title
"Methods of measurement for semiconductor materials, process control, and devices: quarterly report, January 1 to March 31, 1969"
Statement of Responsibility
edited by M. Murray Bullis
Publisher
  • U.S. Dept. of Commerce, National Bureau of Standards
  • For sale by the Superintendent of Documents, U.S. Govt. Print. Off.
Publication Year
  • 1969
Book size
26 cm

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Details 詳細情報について

  • CRID
    1130282272254675328
  • NII Book ID
    BA56325863
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • [Washington]
    • Washington
  • Data Source
    • CiNii Books
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