Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques

Details 詳細情報について

• CRID

  1130282272876177408

• NII Book ID

  BB18869820

• LCCN

  79600131

• Web Site

  https://lccn.loc.gov/79600131

  https://catalog.hathitrust.org/Record/006865775

• Text Lang

  en

• Country Code

  us

• Title Language Code

  en

• Place of Publication

  • Washington

• Classification

  • LCC: QC100
  • LCC: TK7871.85

• Subject

  • LCSH: Semiconductors -- Testing
  • LCSH: Semiconductor industry -- Quality control
  • LCSH: Nondestructive testing
  • LCSH: Acoustic emission testing

• Data Source

  • CiNii Books