Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA

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Bibliographic Information

Title
"Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA"
Statement of Responsibility
Aland K. Chin ... [et al.] chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering
Publisher
  • SPIE
Publication Year
  • c2002
Book size
28 cm

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Details 詳細情報について

  • CRID
    1130282272895959936
  • NII Book ID
    BA6213427X
  • ISBN
    0819443875
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Bellingham, Wash.
  • Data Source
    • CiNii Books
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