Fundamentals of surface and thin film analysis

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Bibliographic Information

Title
"Fundamentals of surface and thin film analysis"
Statement of Responsibility
Leonard C. Feldman, James W. Mayer
Publisher
  • North-Holland : Elsevier Science Pub.
Publication Year
  • c1986
Book size
24 cm

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Notes

Includes bibliographies and index

Details 詳細情報について

  • CRID
    1130282273067384960
  • NII Book ID
    BA0028903X
  • ISBN
    0444009892
  • LCCN
    86002479
  • Web Site
    https://lccn.loc.gov/86002479
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • New York
  • Classification
  • Data Source
    • CiNii Books
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