Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces

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Bibliographic Information

Title
"Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces"
Statement of Responsibility
G. Kaupp
Publisher
  • Springer
Publication Year
  • c2006
Book size
24 cm
Series Name / No
  • : pbk

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Notes

Includes bibliographical references and index

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Details 詳細情報について

  • CRID
    1130282273315370624
  • NII Book ID
    BA78008037
  • ISBN
    3540284052
    9783642066634
  • Text Lang
    en
  • Country Code
    gw
  • Title Language Code
    en
  • Place of Publication
    • Berlin
  • Data Source
    • CiNii Books
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