Critical role of W deposition condition on spin-orbit torque induced magnetization switching in nanoscale W/CoFeB/MgO
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- C. Zhang
- Tohoku University 1 Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, , 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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- S. Fukami
- Tohoku University 1 Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, , 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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- K. Watanabe
- Tohoku University 1 Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, , 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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- A. Ohkawara
- Tohoku University 1 Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, , 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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- S. DuttaGupta
- Tohoku University 1 Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, , 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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- H. Sato
- Tohoku University 2 Center for Spintronics Integrated Systems, , 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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- F. Matsukura
- Tohoku University 1 Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, , 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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- H. Ohno
- Tohoku University 1 Laboratory for Nanoelectronics and Spintronics, Research Institute of Electrical Communication, , 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
書誌事項
- 公開日
- 2016-11-07
- 資源種別
- journal article
- DOI
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- 10.1063/1.4967475
- 公開者
- AIP Publishing
この論文をさがす
説明
<jats:p>We study the spin-orbit torque induced magnetization switching in W/CoFeB/MgO heterostructures with W deposited under different sputtering conditions. We show that the crystal structure and resistivity of W depend on the employed sputtering conditions. Switching current of nanoscale devices is smaller while effective anisotropy field is larger for the devices with more resistive W channel deposited at lower sputtering power and higher Ar gas pressure. The effective spin Hall angle evaluated from the switching probability varies by a factor of 2–3 depending on the W resistivity controlled by the sputtering conditions.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 109 (19), 192405-, 2016-11-07
AIP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360004233919168512
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- ISSN
- 10773118
- 00036951
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- 資料種別
- journal article
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- データソース種別
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- Crossref
- KAKEN
- OpenAIRE

