Fabrication and optical characterization of a TiO2 thin film on a silica microsphere
説明
Abstract We have fabricated a uniform TiO 2 thin film on a silica microsphere by using the so-called sol–gel reaction. Characterization of the TiO 2 thin film was carried out by scanning electron microscopy, Raman scattering, and the attenuated-total-reflection (ATR) method. We have observed optical resonances of microspheres with and without the TiO 2 thin film by using the ATR method, which allowed us to evaluate optically the thickness and the refractive index of the TiO 2 thin film from the resonance due to excited whispering gallery modes, which are resonance modes inherent of microspheres.
収録刊行物
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- Surface Science
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Surface Science 548 (1-3), 59-66, 2004-01
Elsevier BV
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詳細情報 詳細情報について
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- CRID
- 1360011146248179328
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- NII論文ID
- 30004086794
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- ISSN
- 00396028
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- データソース種別
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