<i>In Situ</i> XRD Observation of Crystal Deformation of Piezoelectric (K,Na)NbO<sub>3</sub> Thin Films
-
- Goon Tan
- Mechanical Engineering, Kobe University, 1-1 Rokkodai-cho, Nada-ku, Kobe 657-8501, Japan
-
- Sang Hyo Kweon
- Mechanical Engineering, Kobe University, 1-1 Rokkodai-cho, Nada-ku, Kobe 657-8501, Japan
-
- Kenji Shibata
- SCIOCS, 880, Isagozawa-cho, Hitachi-shi, Ibaraki-ken 319-1418, Japan
-
- Tomoaki Yamada
- Department of Energy Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
-
- Isaku Kanno
- Mechanical Engineering, Kobe University, 1-1 Rokkodai-cho, Nada-ku, Kobe 657-8501, Japan
収録刊行物
-
- ACS Applied Electronic Materials
-
ACS Applied Electronic Materials 2 (7), 2084-2089, 2020-07-06
American Chemical Society (ACS)