Postsynthesis of h‐BN/Graphene Heterostructures Inside a STEM

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  • Zheng Liu
    Nanomaterials Research Institute National Institute of Advanced Industrial Science and Technology (AIST) Tsukuba 305‐8565 Japan
  • Luiz H. G. Tizei
    Laboratoire de Physique des Solides Université Paris‐Sud CNRS‐UMR 8502 Orsay 91405 France
  • Yohei Sato
    Division of Electron Crystallography and Spectroscopy Tohoku University Sendai 980‐8577 Japan
  • Yung‐Chang Lin
    Nanomaterials Research Institute National Institute of Advanced Industrial Science and Technology (AIST) Tsukuba 305‐8565 Japan
  • Chao‐Hui Yeh
    Department of Electrical Engineering National Tsing Hua University Hsinchu 30013 Taiwan
  • Po‐Wen Chiu
    Department of Electrical Engineering National Tsing Hua University Hsinchu 30013 Taiwan
  • Masami Terauchi
    Division of Electron Crystallography and Spectroscopy Tohoku University Sendai 980‐8577 Japan
  • Sumio Iijima
    Meijo University Department of Materials Science and Engeering Nagoya 468‐8502 Japan
  • Kazu Suenaga
    Nanomaterials Research Institute National Institute of Advanced Industrial Science and Technology (AIST) Tsukuba 305‐8565 Japan

説明

Combinations of 2D materials with different physical properties can form heterostructures with modified electrical, mechanical, magnetic, and optical properties. The direct observation of a lateral heterostructure synthesis is reported by epitaxial in-plane graphene growth from the step-edge of hexagonal BN (h-BN) within a scanning transmission electron microscope chamber. Residual hydrocarbon in the chamber is the carbon source. The growth interface between h-BN and graphene is atomically identified as largely N-C bonds. This postgrowth method can form graphene nanoribbons connecting two h-BN domains with different twisting angles, as well as isolated carbon islands with arbitrary shapes embedded in the h-BN layer. The electronic properties of the vertically stacked h-BN/graphene heterostructures are investigated by electron energy-loss spectroscopy (EELS). Low-loss EELS analysis of the dielectric response suggests a robust coupling effect between the graphene and h-BN layers.

収録刊行物

  • Small

    Small 12 (2), 252-259, 2015-11-30

    Wiley

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