Evaluation of Crystal Lattice Rotation around a Stress-Induced Twin in a Step-Graded SiGe / Si (110) Using STEM Moiré Observation and its Image Analysis

詳細情報 詳細情報について

• CRID

  1360286992937217408

• DOI

  10.1017/s1431927619001946

• ISSN

  14358115

  14319276

• Web Site

  https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619001946

• データソース種別

  • Crossref
  • KAKEN