【Updated on Oct. 28, 2024】 Integration of CiNii Dissertations and CiNii Books into CiNii Research
Impact of the Release of the New "NDL Search" on CiNii Services
Trial version of CiNii Research Automatic Translation feature is available on CiNii Labs

Wavelet-based defect detection in solar wafer images with inhomogeneous texture

DOI Web Site Web Site 1 Citations

Journal

Pattern Recognition

Pattern Recognition 45 (2), 742-756, 2012-02

Elsevier BV

Citations (1)*help

See more

Details 詳細情報について

CRID

1360298342843415680
DOI

10.1016/j.patcog.2011.07.025
ISSN

00313203
Web Site

https://api.elsevier.com/content/article/PII:S003132031100313X?httpAccept=text/xml

https://api.elsevier.com/content/article/PII:S003132031100313X?httpAccept=text/plain
Data Source
- Crossref

Export

Report a problem

Back to top