An All-Digital Unified Physically Unclonable Function and True Random Number Generator Featuring Self-Calibrating Hierarchical Von Neumann Extraction in 14-nm Tri-gate CMOS
Journal
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- IEEE Journal of Solid-State Circuits
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IEEE Journal of Solid-State Circuits 54 (4), 1074-1085, 2019-04
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1360298762221288320
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- ISSN
- 1558173X
- 00189200
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- Data Source
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- Crossref