Strain mapping at the interface of InP/In<i> _x </i>Ga_1-<i>x</i>As/InP as measured by the scanning transmission electron microscope-moiré fringe method

詳細情報 詳細情報について

• CRID

  1360566399836761216

• NII論文ID

  210000157167

• DOI

  10.7567/1882-0786/ab4604

• ISSN

  18820786

  18820778

• Web Site

  http://iopscience.iop.org/article/10.7567/1882-0786/ab4604

  http://iopscience.iop.org/article/10.7567/1882-0786/ab4604/pdf

  https://iopscience.iop.org/article/10.7567/1882-0786/ab4604/pdf

  https://iopscience.iop.org/article/10.7567/1882-0786/ab4604

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