Direct observation of the leakage current in epitaxial diamond Schottky barrier devices by conductive-probe atomic force microscopy and Raman imaging

詳細情報 詳細情報について

• CRID

  1360567184344031104

• DOI

  10.1088/0022-3727/47/35/355102

• ISSN

  13616463

  00223727

• Web Site

  http://stacks.iop.org/0022-3727/47/i=35/a=355102/pdf

  http://stacks.iop.org/0022-3727/47/i=35/a=355102?key=crossref.9c224b2fe98a52b03f2ee93e04655e02

• データソース種別

  • Crossref
  • KAKEN