Total Dose Evaluation of Deep Submicron CMOS Imaging Technology Through Elementary Device and Pixel Array Behavior Analysis

DOI PDF 1 Citations

Journal

IEEE Transactions on Nuclear Science

IEEE Transactions on Nuclear Science 55 (6), 3494-3501, 2008-12

Institute of Electrical and Electronics Engineers (IEEE)

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Details 詳細情報について

CRID

1360574095223882112
DOI

10.1109/tns.2008.2005294
ISSN

00189499
Web Site

http://xplorestaging.ieee.org/ielx5/23/4723712/04723808.pdf?arnumber=4723808
Data Source
- Crossref

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