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<i>I</i> <i>n</i> <i>s</i> <i>i</i> <i>t</i> <i>u</i> vaporization of very low molecular weight resists using 1/2 nm diameter electron beams
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- M. Isaacson
- School of Applied and Engineering Physics
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- A. Muray
- School of Applied and Engineering Physics
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Description
<jats:p>A technique is presented for in situ measurements of contrast curves for electron beam vaporizable resists. Using a 1/2 nm diam beam of 100 keV electrons, we have etched lines, holes and patterns in NaCl crystals at the 2 nm size scale. Troughs about 1.5 nm wide on 4.5 nm centers and 2 nm diam holes have been etched completely through NaCl crystals more than 30 nm thick.</jats:p>
Journal
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- Journal of Vacuum Science and Technology
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Journal of Vacuum Science and Technology 19 (4), 1117-1120, 1981-11-01
American Vacuum Society
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Details 詳細情報について
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- CRID
- 1360579816420398464
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- NII Article ID
- 30020330064
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- NII Book ID
- AA10635106
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- DOI
- 10.1116/1.571180
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- ISSN
- 00225355
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- Data Source
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- Crossref
- CiNii Articles