Requirements-Driven Test Generation for Autonomous Vehicles With Machine Learning Components
Journal
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- IEEE Transactions on Intelligent Vehicles
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IEEE Transactions on Intelligent Vehicles 5 (2), 265-280, 2020-06
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1360580234593752064
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- ISSN
- 23798904
- 23798858
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- Data Source
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- Crossref