Recovery Strategy of Fatigue-Limited Endurance in Si FeFETs With Thin HfZrO₂ Films

DOI PDF 参考文献29件

Zuocheng Cai

Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan
Zhenhong Liu

Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan
Yan-Kui Liang

Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan
Xueyang Han

Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan
Shin-Yi Min

Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan
Eishin Nako

Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan
Seong-Kun Cho

Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan
Chia-Tsong Chen

Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan
Mitsuru Takenaka

Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan
Kasidit Toprasertpong

Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan
Shinichi Takagi

Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan

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権利情報

DOI

IEEE Transactions on Electron Devices

IEEE Transactions on Electron Devices 72 (1), 467-473, 2025-01

Institute of Electrical and Electronics Engineers (IEEE)