XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures

DOI Web Site Web Site 被引用文献8件

収録刊行物

Journal of Electron Spectroscopy and Related Phenomena

Journal of Electron Spectroscopy and Related Phenomena 184 (7), 399-409, 2011-07

Elsevier BV

被引用文献 (8)*注記

もっと見る

詳細情報詳細情報について

CRID

1360855569053883264
DOI

10.1016/j.elspec.2011.04.002
ISSN

03682048
Web Site

https://api.elsevier.com/content/article/PII:S0368204811000727?httpAccept=text/xml

https://api.elsevier.com/content/article/PII:S0368204811000727?httpAccept=text/plain
データソース種別
- Crossref

書き出し

問題の指摘

ページトップへ