Formation of Defects in Two-Dimensional MoS<sub>2</sub> in the Transmission Electron Microscope at Electron Energies below the Knock-on Threshold: The Role of Electronic Excitations

  • Silvan Kretschmer
    Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, 01328 Dresden, Germany
  • Tibor Lehnert
    Central Facility for Electron Microscopy, Group of Electron Microscopy of Materials Science, Ulm University, Ulm 89081, Germany
  • Ute Kaiser
    Central Facility for Electron Microscopy, Group of Electron Microscopy of Materials Science, Ulm University, Ulm 89081, Germany
  • Arkady V. Krasheninnikov
    Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, 01328 Dresden, Germany

収録刊行物

  • Nano Letters

    Nano Letters 20 (4), 2865-2870, 2020-03-20

    American Chemical Society (ACS)

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