Formation of Defects in Two-Dimensional MoS<sub>2</sub> in the Transmission Electron Microscope at Electron Energies below the Knock-on Threshold: The Role of Electronic Excitations

DOI Web Site 2 Citations

Silvan Kretschmer

Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, 01328 Dresden, Germany
Tibor Lehnert

Central Facility for Electron Microscopy, Group of Electron Microscopy of Materials Science, Ulm University, Ulm 89081, Germany
Ute Kaiser

Central Facility for Electron Microscopy, Group of Electron Microscopy of Materials Science, Ulm University, Ulm 89081, Germany
Arkady V. Krasheninnikov

Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, 01328 Dresden, Germany

Journal

Nano Letters

Nano Letters 20 (4), 2865-2870, 2020-03-20

American Chemical Society (ACS)

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