Formation of Defects in Two-Dimensional MoS<sub>2</sub> in the Transmission Electron Microscope at Electron Energies below the Knock-on Threshold: The Role of Electronic Excitations
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- Silvan Kretschmer
- Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, 01328 Dresden, Germany
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- Tibor Lehnert
- Central Facility for Electron Microscopy, Group of Electron Microscopy of Materials Science, Ulm University, Ulm 89081, Germany
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- Ute Kaiser
- Central Facility for Electron Microscopy, Group of Electron Microscopy of Materials Science, Ulm University, Ulm 89081, Germany
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- Arkady V. Krasheninnikov
- Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, 01328 Dresden, Germany
収録刊行物
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- Nano Letters
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Nano Letters 20 (4), 2865-2870, 2020-03-20
American Chemical Society (ACS)