Material Classification Using Raw Time-of-Flight Measurements

DOI PDF 3 Citations

Journal

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) 3503-3511, 2016-06

IEEE

Citations (3)*help

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Details 詳細情報について

CRID

1360857612929461120
DOI

10.1109/cvpr.2016.381
Web Site

http://xplorestaging.ieee.org/ielx7/7776647/7780329/07780750.pdf?arnumber=7780750
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- Crossref

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