Automatic epileptic seizure detection in EEGs based on optimized sample entropy and extreme learning machine

詳細情報 詳細情報について

• CRID

  1360861713053215488

• DOI

  10.1016/j.jneumeth.2012.07.003

• ISSN

  01650270

• Web Site

  https://api.elsevier.com/content/article/PII:S0165027012002671?httpAccept=text/xml

  https://api.elsevier.com/content/article/PII:S0165027012002671?httpAccept=text/plain

• データソース種別

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