Measurement of C2 radical density in microwave methane/hydrogen plasma used for nanocrystalline diamond film formation

書誌事項

公開日
2003-03
権利情報
  • https://www.elsevier.com/tdm/userlicense/1.0/
DOI
  • 10.1016/s0925-9635(02)00216-9
公開者
Elsevier BV

この論文をさがす

説明

Abstract C 2 radical density in a conventional microwave plasma-enhanced chemical vapor deposition (MWPCVD) with CH 4 /H 2 mixture was measured using absorption spectroscopy. At the typical growth conditions for MWPCVD used for nanocrystalline diamond formation, C 2 radical density in the plasma was of the order of 10 12 cm −3 . Correlation between nanocrystalline diamond growth and C 2 radical density was discussed.

収録刊行物

被引用文献 (7)*注記

もっと見る

詳細情報 詳細情報について

問題の指摘

ページトップへ