Measurement of C2 radical density in microwave methane/hydrogen plasma used for nanocrystalline diamond film formation
書誌事項
- 公開日
- 2003-03
- 権利情報
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- https://www.elsevier.com/tdm/userlicense/1.0/
- DOI
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- 10.1016/s0925-9635(02)00216-9
- 公開者
- Elsevier BV
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説明
Abstract C 2 radical density in a conventional microwave plasma-enhanced chemical vapor deposition (MWPCVD) with CH 4 /H 2 mixture was measured using absorption spectroscopy. At the typical growth conditions for MWPCVD used for nanocrystalline diamond formation, C 2 radical density in the plasma was of the order of 10 12 cm −3 . Correlation between nanocrystalline diamond growth and C 2 radical density was discussed.
収録刊行物
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- Diamond and Related Materials
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Diamond and Related Materials 12 (3-7), 365-368, 2003-03
Elsevier BV
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詳細情報 詳細情報について
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- CRID
- 1361137043498745984
-
- ISSN
- 09259635
- http://id.crossref.org/issn/09259635
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- データソース種別
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- Crossref
- OpenAIRE
