Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling

DOI PDF 5 Citations

Journal

IEEE Custom Integrated Circuits Conference 2006

IEEE Custom Integrated Circuits Conference 2006 437-444, 2006-09

IEEE

Citations (5)*help

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Details 詳細情報について

CRID

1361137045310465408
DOI

10.1109/cicc.2006.321010
Web Site

http://xplorestaging.ieee.org/ielx5/4114893/4114894/04114997.pdf?arnumber=4114997
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