Scanning probe microscopy for testing ultrafast electronic devices

Details 詳細情報について

• CRID

  1361418519177187968

• DOI

  10.1007/bf00820151

• ISSN

  1572817X

  03068919

• Web Site

  http://link.springer.com/content/pdf/10.1007/BF00820151.pdf

  http://link.springer.com/article/10.1007/BF00820151/fulltext.html

  http://link.springer.com/content/pdf/10.1007/BF00820151

• Data Source

  • Crossref