A Unified Carrier-Transport Model for the Nanoscale Surrounding-Gate MOSFET Comprising Quantum–Mechanical Effects

DOI PDF 1 Citations

Journal

IEEE Transactions on Electron Devices

IEEE Transactions on Electron Devices 58 (7), 1830-1836, 2011-07

Institute of Electrical and Electronics Engineers (IEEE)

Citations (1)*help

See more

Keywords

Details 詳細情報について

CRID

1361418519337197056
DOI

10.1109/ted.2011.2136343
ISSN

15579646

00189383
Web Site

http://xplorestaging.ieee.org/ielx5/16/5896011/05755186.pdf?arnumber=5755186
Data Source
- Crossref

Export

Report a problem

Back to top