Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

DOI PDF 3 Citations
  • Maik Scheller
    Technische Universität Braunschweig 1 Institut für Hochfrequenztechnik, , Schleinitzstr. 22, 38106 Braunschweig, Germany
  • Kai Baaske
    Technische Universität Braunschweig 1 Institut für Hochfrequenztechnik, , Schleinitzstr. 22, 38106 Braunschweig, Germany
  • Martin Koch
    Philipps-Universität Marburg 2 Fachbereich Physik, , Renthof 5, 35032 Marburg, Germany

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<jats:p>We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.</jats:p>

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