A cost-effective scan architecture for scan testing with non-scan test power and test application cost
書誌事項
- 公開日
- 2003
- DOI
-
- 10.1145/776019.776022
- 公開者
- ACM Press
収録刊行物
-
- Proceedings of the 40th conference on Design automation - DAC '03
-
Proceedings of the 40th conference on Design automation - DAC '03 2003
ACM Press
