A 0.1–3.5-GHz Duty-Cycle Measurement and Correction Technique in 130-nm CMOS

DOI PDF 1 Citations

Journal

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (5), 1975-1983, 2016-05

Institute of Electrical and Electronics Engineers (IEEE)

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Details 詳細情報について

CRID

1361699995132436480
DOI

10.1109/tvlsi.2015.2478804
ISSN

15579999

10638210
Web Site

http://xplorestaging.ieee.org/ielx7/92/7456352/07294695.pdf?arnumber=7294695
Data Source
- Crossref

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