Gate sizing: finFETs vs 32nm bulk MOSFETs
Journal
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- 2006 43rd ACM/IEEE Design Automation Conference
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2006 43rd ACM/IEEE Design Automation Conference 2006
IEEE
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Details 詳細情報について
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- CRID
- 1361981471470878336
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- ISSN
- 0738100X
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- Data Source
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- Crossref