Analytical inversion of photothermal measurements: Independent determination of the thermal conductivity and diffusivity of a conductive layer deposited on an insulating substrate

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  • Christian Frétigny
    UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
  • Jean Paul Roger
    UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
  • Valérie Reita
    UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France
  • Danièle Fournier
    UMR 7615 CNRS/UPMC Laboratoire PPMD, , ESPCI 10 rue Vauquelin 75231 Paris Cedex 5, France and Laboratoire PEM, , ESPCI, 10 rue Vauquelin 75231 Paris Cedex 5, France

Bibliographic Information

Published
2007-12-01
DOI
  • 10.1063/1.2818102
Publisher
AIP Publishing

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<jats:p>The long distance behavior of the surface temperature wave in a thermoreflectance microscopy experiment is established for a conductive layer deposited on an insulating substrate. At large distance from the point source, heat is confined, so the amplitude decrease is lower than for a bulk sample. From the slopes which appear on the phase and on the log scale amplitude, a procedure is proposed to extract, separately, the thermal diffusivity and conductivity of the layer, taking into account data obtained at different modulation frequencies. Experimental results are presented which confirm the validity of the method.</jats:p>

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