Study of Random Dopant Fluctuation Effects in Germanium-Source Tunnel FETs

詳細情報 詳細情報について

• CRID

  1362544419931292544

• DOI

  10.1109/ted.2011.2161990

• ISSN

  15579646

  00189383

• Web Site

  http://xplorestaging.ieee.org/ielx5/16/6022820/05985514.pdf?arnumber=5985514

• データソース種別

  • Crossref