Product or sum: comparative tests of Voigt, and product or sum of Gaussian and Lorentzian functions in the fitting of synthetic Voigt‐based X‐ray photoelectron spectra

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<jats:title>Abstract</jats:title><jats:p>A comparative study for the fitting of X‐ray photoelectron spectra (XPS) using different model functions is presented. Synthetically generated test spectra using Gaussian/Lorentzian convolution and a real measured spectrum are fitted with the three commonly used models: product, sum and Gaussian/Lorentzian convolution functions. In these limited tests, it was found that the sum function is superior to the product function, particularly for low‐noise spectra. Copyright © 2007 John Wiley & Sons, Ltd.</jats:p>

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