Deep learning for FTIR histology: leveraging spatial and spectral features with convolutional neural networks
-
- Sebastian Berisha
- Department of Electrical and Computer Engineering
-
- Mahsa Lotfollahi
- Department of Electrical and Computer Engineering
-
- Jahandar Jahanipour
- Department of Electrical and Computer Engineering
-
- Ilker Gurcan
- Department of Electrical and Computer Engineering
-
- Michael Walsh
- Department of Pathology
-
- Rohit Bhargava
- Departments of Bioengineering
-
- Hien Van Nguyen
- Department of Electrical and Computer Engineering
-
- David Mayerich
- Department of Electrical and Computer Engineering
説明
<p>Infrared spectroscopy combined with deep learning provide an automated and quantitative alternative to traditional histological examination.</p>
収録刊行物
-
- The Analyst
-
The Analyst 144 (5), 1642-1653, 2019
Royal Society of Chemistry (RSC)