Fault Site Pruning for Practical Reliability Analysis of GPGPU Applications

DOI PDF 1 Citations

Journal

2018 51st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO)

2018 51st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO) 2018-10

IEEE

Citations (1)*help

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Details 詳細情報について

CRID

1362825894128330752
DOI

10.1109/micro.2018.00066
Web Site

http://xplorestaging.ieee.org/ielx7/8573939/8574517/08574583.pdf?arnumber=8574583
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- Crossref

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