High-efficiency soft x-ray emission spectrometer for use with synchrotron radiation excitation

DOI PDF 被引用文献5件
  • T. A. Callcott
    Department of Physics, University of Tennessee, Knoxville, Tennessee 37996–1200
  • K. L. Tsang
    Department of Physics, University of Tennessee, Knoxville, Tennessee 37996–1200
  • C. H. Zhang
    Department of Physics, University of Tennessee, Knoxville, Tennessee 37996–1200
  • D. L. Ederer
    Synchrotron Ultraviolet Radiation Facility, National Bureau of Standards, Gaithersburg, Maryland 20899
  • E. T. Arakawa
    Health and Safety Research Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37930

書誌事項

公開日
1986-11-01
DOI
  • 10.1063/1.1139078
公開者
AIP Publishing

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説明

<jats:p>A new soft x-ray spectrometer designed for use with photon excitation from synchrotron light sources is described and characterized. Special design features, including a close-spaced input slit, large toroidal gratings, and a two-dimensional charge-coupled-device array based detector system, provide exceptional measuring efficiency in a 5-m Rowland circle design. Descriptions are given of the spectrometer’s mechanical and detector design, and of calibration and alignment procedures. The beam line providing photon excitation from a synchrotron light source is described. Typical electron beam and/or photon excited emission spectra of Al, Si, and LiF are presented and compared with those produced by other instruments.</jats:p>

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