Direct transfer patterning on three dimensionally deformed surfaces at micrometer resolutions and its application to hemispherical focal plane detector arrays

詳細情報 詳細情報について

• CRID

  1363670318940487552

• DOI

  10.1016/j.orgel.2008.07.011

• ISSN

  15661199

• Web Site

  https://api.elsevier.com/content/article/PII:S1566119908001341?httpAccept=text/xml

  https://api.elsevier.com/content/article/PII:S1566119908001341?httpAccept=text/plain

• データソース種別

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