Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy
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- Y. Zhu
- Monash Centre for Electron Microscopy, Monash University 1 , Victoria 3800, Australia
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- A. Soukiassian
- Department of Materials Science and Engineering, Cornell University 3 , Ithaca, New York 14853, USA
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- D. G. Schlom
- Department of Materials Science and Engineering, Cornell University 3 , Ithaca, New York 14853, USA
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- D. A. Muller
- Kavli Institute at Cornell for Nanoscale Science 4 , Ithaca, New York 14853, USA
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- C. Dwyer
- Monash Centre for Electron Microscopy, Monash University 1 , Victoria 3800, Australia
書誌事項
- 公開日
- 2013-09-30
- DOI
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- 10.1063/1.4823704
- 公開者
- AIP Publishing
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説明
<jats:p>Atomic-resolution elemental maps of materials obtained using energy-loss spectroscopy in the scanning transmission electron microscope (STEM) can contain artifacts associated with strong elastic scattering of the STEM probe. We demonstrate how recent advances in instrumentation enable a simple and robust approach to reduce such artifacts and produce atomic-resolution elemental maps amenable to direct visual interpretation. The concept is demonstrated experimentally for a (BaTiO3)8/(SrTiO3)4 heterostructure, and simulations are used for quantitative analysis. We also demonstrate that the approach can be used to eliminate the atomic-resolution elastic contrast in maps obtained from lower-energy excitations, such as plasmon excitations.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 103 (14), 141908-, 2013-09-30
AIP Publishing
