SEU Prediction From SET Modeling Using Multi-Node Collection in Bulk Transistors and SRAMs Down to the 65 nm Technology Node

DOI PDF 3 Citations

Journal

IEEE Transactions on Nuclear Science

IEEE Transactions on Nuclear Science 58 (3), 1338-1346, 2011-06

Institute of Electrical and Electronics Engineers (IEEE)

Citations (3)*help

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Details 詳細情報について

CRID

1364233269147940864
DOI

10.1109/tns.2011.2144622
ISSN

15581578

00189499
Web Site

http://xplorestaging.ieee.org/ielx5/23/5875999/05778956.pdf?arnumber=5778956
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