A scale model of general repair

DOI Web Site Web Site 2 Citations

M.S. Finkelstein

Journal

Microelectronics Reliability

Microelectronics Reliability 33 (1), 41-44, 1993-01

Elsevier BV

Citations (2)*help

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Details 詳細情報について

CRID

1364233270640904064
DOI

10.1016/0026-2714(93)90042-w
ISSN

00262714
Web Site

https://api.elsevier.com/content/article/PII:002627149390042W?httpAccept=text/xml

https://api.elsevier.com/content/article/PII:002627149390042W?httpAccept=text/plain
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