Strained hetero interfaces in Si/SiGe/SiGe/SiGe multi-layers studied by scanning moiré fringe imaging
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- Kim
- 作成者
収録刊行物
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- J Appl Phys
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J Appl Phys 114 2013
詳細情報
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- CRID
- 1371694367043061892
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- データソース種別
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- Crossref