回折格子モノクロメータの高次回折光を利用した2波長域同時分光測定

大久保 和明

doi:10.2150/jieij1980.70.6_262

回折格子モノクロメータの高次回折光を利用した2波長域同時分光測定

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大久保和明

松下電器産業 (株) 照明研究所

書誌事項

タイトル別名

Simultaneous Spectral Measurement for a Twin Wavelength Rigions using High Order Diffraction Spectra of a Grating
カイセツコウシモノクロメータノコウジカイセツヒカリオリヨウシタ

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説明

An attempt was made to develop a method to measure simultaneously for twin wavelength regions (from 400 nm to 750 nm and from 700 nm to 2500 nm) using first and second orders diffraction spectra of a grating.<BR>The second order diffraction spectrum of a grating, whose first order diffraction spectrum was used for the infrared spectral measurement, was able to be measured precisely for the visible spectrum of light sources.<BR>First and second order diffraction spectra of a grating were separated from each other with a cold mirror, so that the visible and infrared spectrum of a light source were able to be measured simultaneously.<BR>As a result, visible and infrared spectral measurement was carried out efficiently and precisely with a infrared grating monochromator.